The effects of trimming methods on current noise in thick-film resistors : C. Y. Kuo. Proc. 21st Electronic Components Conf., Washington DC, USA, 10–12 May (1971), p. 389

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 219 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(72)90794-9