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The effects of stacking faults on the electrical properties of a high voltage power transistor

✍ Scribed by T. Kato; H. Koyama; T. Matsukawa; K. Fujikawa

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 519 KB
Volume: 19
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(76)90109-x

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