The effects of stacking faults on the electrical properties of a high voltage power transistor : T. Kato, H. Koyama, T. Matsukawa and K. Fujikawa. Solid-St. Electron.19, 955 (1976)

• Publisher: Elsevier Science
• Year: 1977
• Tongue: English
• Weight: 86 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(77)90012-9