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The effects of sputtering damage on the characteristics of molybdenum-silicon Schottky barrier diodes : Francis H. Mullins and Arthur Brunnschweiler. Solid State Electronics19, 47 (1976)

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 121 KB
Volume: 15
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(76)90349-8

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