The effects of radiation damage on the properties of Ni-nGaAs Schottky diodes—II. Terminal characteristics : Paul D. Taylor and D. Vernon Morgan. Solid-State Electronics19, 481 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 124 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90400-5