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The Effects of Proton-Defect Interactions on Radiation-Induced Interface-Trap Formation and Annealing

โœ Scribed by Hughart, D. R.; Schrimpf, R. D.; Fleetwood, D. M.; Rowsey, N. L.; Law, M. E.; Tuttle, B. R.; Pantelides, S. T.


Book ID
118064147
Publisher
IEEE
Year
2012
Tongue
English
Weight
895 KB
Volume
59
Category
Article
ISSN
0018-9499

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