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The effects of post-deposition annealing on the microstructure of electron-beam evaporated indium tin oxide thin films

โœ Scribed by A.S.A.C. Diniz; C.J. Kiely; I. Elfalla; R.D. Pilkington; A.E. Hill


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
279 KB
Volume
5
Category
Article
ISSN
0960-1481

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