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The effects of post-annealing on the performance of ZnO thin film transistors

โœ Scribed by Seokhwan Bang; Seungjun Lee; Joohyun Park; Soyeon Park; Youngbin Ko; Changhwan Choi; Hojung Chang; Hyungho Park; Hyeongtag Jeon


Book ID
113937063
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
887 KB
Volume
519
Category
Article
ISSN
0040-6090

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