𝔖 Bobbio Scriptorium

✦ LIBER ✦

The effects of oxide traps on the MOS capacitance : F. P. Heiman and G. Warfield. I.E.E.E. Trans. on Electron Devices, Vol. ED-12, No. 4, April 1965, p. 167

Book ID: 113190205
Publisher: Elsevier Science
Year: 1965
Tongue: English
Weight: 197 KB
Volume: 4
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(65)90215-5

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