Limitations of the MOS capacitance method for the determination of semiconductor surface properties : K. H. Zaininger and G. Warfield. I.E.E.E. Trans. on Electron Devices, Vol. ED-12, No. 4, April 1965, p. 179

• Book ID: 113190206
• Publisher: Elsevier Science
• Year: 1965
• Tongue: English
• Weight: 101 KB
• Volume: 4
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(65)90216-7