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The Effects of Mechanical Uniaxial Stress on Junction Leakage in Nanoscale CMOSFETs

✍ Scribed by Tzu-Juei Wang; Chih-Hsin Ko; Shoou-Jinn Chang; San-Lein Wu; Ta-Ming Kuan; Wen-Chin Lee


Book ID
114619061
Publisher
IEEE
Year
2008
Tongue
English
Weight
319 KB
Volume
55
Category
Article
ISSN
0018-9383

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