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On the threshold voltage of nanoscale bulk nMOSFETs with [110]/(001) uniaxial stress and quantum effects

✍ Scribed by Wang, Guanyu; Zhang, Heming; Wang, Wei; Yuan, Jun; Wang, Zhen


Book ID
121581343
Publisher
Springer
Year
2014
Tongue
English
Weight
686 KB
Volume
13
Category
Article
ISSN
1569-8025

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