𝔖 Bobbio Scriptorium

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The effects of in-plane stress on waves in thin films : Johnson, G.C.; Chen, S.-E. Nondestructive Characterization of Materials IV. Edited by C.O. Ruud, J.F. Bussiere and R.E. Green. pp. 239–246. Plenum Press (1991).

Book ID: 111712456
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 161 KB
Volume: 28
Category: Article
ISSN: 0963-8695
DOI: 10.1016/0963-8695(95)93304-o

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