𝔖 Bobbio Scriptorium

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Evaluation of surface layer residual stresses and lattice distortions in ion implanted materials by x-ray diffraction : Nondestructive characterisation of materials 2, Montreal (Canada), 21–23 Jul, 1986. pp. 595–604. Edited by J.F. Bussiere, J.P. Monchalin, C.O. Ruud, R.E. Green Jr. Plenum Press, 1987

✍ Scribed by E.D. Roll; R.N. Pangborn; M.F. Amateau

Publisher: Elsevier Science
Year: 1989
Weight: 170 KB
Volume: 22
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(89)91162-0

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