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The effects of cesium equilibrium on H− ion beam production with LANSCE surface converter ion source

✍ Scribed by O. Tarvainen


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
736 KB
Volume
601
Category
Article
ISSN
0168-9002

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Focused ion beam (FIB) milling is the typical method used to fabricate micropillars to study small-scale plasticity and size effects in uniaxial compression. However, FIB milling can introduce defects into the milled pillars. To investigate the effects of FIB damage on mechanical behavior, we tested