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The effects of beam line pressure on the beam quality of an electron cyclotron resonance ion source

✍ Scribed by V. Toivanen; O. Steczkiewicz; O. Tarvainen; T. Ropponen; J. Ärje; H. Koivisto

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
670 KB
Volume
268
Category
Article
ISSN
0168-583X

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