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The effect of X-ray penetration depth on structural characterization of multiphase Bi-Sr-Ca-Cu-O thin films by X-ray diffraction techniques

โœ Scribed by T.N. Blanton; C.L. Barnes; M. Lelental


Book ID
108024871
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
452 KB
Volume
173
Category
Article
ISSN
0921-4534

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