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The Effect of the Photo-Induced Carriers on the Reliability of Oxide TFTs Under Various Intensities of Light

✍ Scribed by Soo-Yeon Lee; Sun-Jae Kim; Young Wook Lee; Woo-Geun Lee; Kap-Soo Yoon; Jang-Yeon Kwon; Min-Koo Han


Book ID
119799677
Publisher
IEEE
Year
2012
Tongue
English
Weight
308 KB
Volume
33
Category
Article
ISSN
0741-3106

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