The effect of protons on the performance of swept-charge devices

✍ Scribed by Smith, David R.; Gow, Jason

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 319 KB
• Volume: 604
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2009.01.051

✦ Synopsis

The e2v technologies CCD54, or swept-charge device (SCD) has been extensively radiation tested for use in the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument, to be launched as a part of the Indian Space Research Organisation (ISRO) Chandrayaan-1 payload in 2008. The principle use of the SCD is in X-ray fluorescence (XRF) applications, the device providing a relatively large collecting area of 1.1 cm 2 , and achieving near Fano-limited spectroscopy at À15 1C, a temperature that is easily obtained using a thermoelectric cooler (TEC). This paper describes the structure and operation of the SCD and details the methodology and results obtained from two proton irradiation studies carried out in 2006 and 2008, respectively to quantify the effects of proton irradiation on the operational characteristics of the device. The analysis concentrates on the degradation of the measured FWHM of various elemental lines and quantifies the effects of proton fluence on the observed X-ray fluorescence spectra from mineralogical target samples.