The effect of prolonged elevated temperature exposure on thick-film resistors : K. R. Bube. Proceedings ISHM Microelectronics Symposium, October–November (1972), p. 2-A-6-1

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 117 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(73)90569-6