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Characterization of a thick-film resistor conduction mechanism : A. B. Usowski and A. J. Van Zeeland. Proceedings ISHM Microelectronics Symposium, October–November (1972), p. 2-A-2-1

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 117 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90567-2

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