The effect of post-annealing on the critical current recovery of bending-deformed (Bi,Pb)-2223/Ag tapes

✍ Scribed by L. Zhao; L. Xie; P. Li; T.-M. Qu; Y. Song; X.-C. Wang; Z. Han

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 648 KB
• Volume: 463-465
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/j.physc.2007.02.034

✦ Synopsis

Bi,Pb)-2223/Ag tape fabricated by PIT methods is a promising candidate for electrical power application. In these applications, the tape often undergoes a winding process, which leads to the degradation of the critical current. In this paper, we report the effect of postannealing on the critical current (I c ) recovery of bent-deformed (Bi,Pb)-2223/Ag multi-filamentary tapes. The tapes were bent at room temperature with different curvatures, then straightened and post-annealed with different processing parameters, including post-annealing temperature, dwelling time and oxygen partial pressure. The experiment results show that rather high I c value could be obtained by post-annealing even for the tapes whose bending strain was 0.8%. SEM observation shows that the decreasing in I c value is caused by the formation and propagation of transverse micro-cracks in the (Bi,Pb)-2223 filaments and the effect of post-annealing could be related to the healing of micro-cracks caused by bending strain as well as the improving of grain connectivity.