Effect of lead oxide compounds on microstructure and critical current density of (Bi,Pb)-2223/Ag tapes
โ Scribed by M.Y. Li; Y. Song; T.M. Qu; Z. Han
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 359 KB
- Volume
- 426-431
- Category
- Article
- ISSN
- 0921-4534
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๐ SIMILAR VOLUMES
The effect of sweep rate of applied current (dI/dt) on critical current (I c ) of Ag-sheathed Bi 2 Pb x Sr 2-x Ca 2 Cu 3 O y (Ag-Bi-2223) tapes was studied by the four-probe measurement method of V-I curves. It was found that the V-I curves were affected apparently by dI/dt, resulting I c , decrease
Bi,Pb)-2223/Ag tape fabricated by PIT methods is a promising candidate for electrical power application. In these applications, the tape often undergoes a winding process, which leads to the degradation of the critical current. In this paper, we report the effect of postannealing on the critical cur