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The effect of orientation, grain size and polymorphism on magnetic properties of sputtered Co-Re thin film media

✍ Scribed by Tu Chen; Yamashita, T.; Sinclair, R.

Book ID: 114645615
Publisher: IEEE
Year: 1981
Tongue: English
Weight: 451 KB
Volume: 17
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.1981.1061483

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