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The effect of ice build-up on the soft X-ray response of a charge coupled device (CCD)

โœ Scribed by Kieran J McCarthy; Alan Owens; J Spragg; I.W Kirkman


Book ID
108415033
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
157 KB
Volume
416
Category
Article
ISSN
0168-9002

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