The Noise Performance of Electron-Multiplying Charge-Coupled Devices at Soft X-Ray Energy Values

✍ Scribed by Tutt, J. H.; Holland, A. D.; Murray, N. J.; Hall, D. J.; Harriss, R. D.; Clarke, A.; Evagora, A. M.

• Book ID: 114621027
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 949 KB
• Volume: 59
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2012.2200488