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The effect of gate-oxide process variations on the long-term fading of PMOS dosimeters

✍ Scribed by A. Kelleher; N. McDonnell; B. O'Neill; W. Lane; L. Adams


Book ID
108028182
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
543 KB
Volume
37-38
Category
Article
ISSN
0924-4247

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