✦ LIBER ✦

The Effect of Electromagnetic Retardation on the Rupture Process of a Very Thin Liquid Film

✍ Scribed by Chi-Chuan Hwang; Te-Chih Ke; Chaur-Kie Lin; Chih-Woei Shiau

Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 80 KB
Volume: 219
Category: Article
ISSN: 0021-9797
DOI: 10.1006/jcis.1999.6493

No coin nor oath required. For personal study only.

✦ Synopsis

Effects of electromagnetic retardation on the rupture process of a very thin liquid film coated on a flat plate are studied. The analysis results indicate that the electromagnetic retardation effect (D) for the case A > 0 (attraction) is a stabilization factor, which prolongs the rupture time. The wavenumber of the most unstable mode is decreasing as D increases. It is also found that the linear solution of rupture time T LM is larger than the nonlinear rupture time T NM , but the gradient of T LM to D is comparable to that of T NM .

📜 SIMILAR VOLUMES

On the Rupture Process of Thin Liquid Fi

On the Rupture Process of Thin Liquid Film

✍ Chi-Chuan Hwang; Shang-Hwei Chang; Jun-Liang Chen 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 166 KB

Effects of Inertia on the Rupture Proces

Effects of Inertia on the Rupture Process of a Thin Liquid Film

✍ Jun-Liang Chen; Chi-Chuan Hwang 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 98 KB

Direct Measurement of the Laplace Pressu

Direct Measurement of the Laplace Pressure in a Very Thin Liquid Film

✍ Bo Zhang; Akira Nakajima 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 83 KB

Meniscus force plays an important part in magnetic storage devices, scanning probe microscopy, and micromachines, because the meniscus force increases steeply as the clearance between solid surfaces decreases down to submicrometers. Recently increased experimental and analytical studies on the subje

Effect of process parameters on the opti

Effect of process parameters on the optical constants of thin metal films

✍ Tompkins, Harland G.; Baker, Jeffrey H.; Convey, Diana 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 78 KB 👁 2 views

In this study, we show that the optical constants of sputter-deposited chromium depend on the argon pressure used for the deposition. Higher argon pressure gives lower extinction coefficients. Sheet resistance measurements show that those materials with lower extinction coefficients also have lower

Investigation of the Effect of an Ether

Investigation of the Effect of an Ether Moiety on the Liquid Crystallinity by Thin Film Polymerization

✍ Si-Xue Cheng; Tai-Shung Chung 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 481 KB 👁 2 views

The formation of rising liquid thin film

The formation of rising liquid thin film on the fluted surface of a horizontal tube

✍ Li Yan; Mei Ning 📂 Article 📅 2005 🏛 John Wiley and Sons 🌐 English ⚖ 386 KB

The purpose of this study is to investigate the mechanism of the formation of the rising liquid thin film and its flow characteristics on the fluted surface of a horizontal tube. By analyzing the wetting behaviors of the fluted tube, which was primarily responsible for the formation of the rising li