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The Effect of Annealing Treatment on the Distribution of Deuterium in Silicon and in Silicon/Silicon Oxide Systems

✍ Scribed by Park, Heungsoo


Book ID
118250298
Publisher
The Electrochemical Society
Year
1992
Tongue
English
Weight
628 KB
Volume
139
Category
Article
ISSN
0013-4651

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Annealing Behaviour of Deuterium in Sili
✍ J. Likonen; E. Vainonen-Ahlgren; T. Ahlgren; S. Lehto; T. Sajavaara; W. Rydman; πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 132 KB

Annealing behaviour of deuterium in carbon films with different Si contents deposited by a pulsed arc discharge method in deuterium atmosphere was studied. The concentration profiles of D were measured by secondary ion mass spectrometry and elastic recoil detection techniques. A model taking into ac