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The effect of annealing on the structure and dielectric properties of BaxSr1−xTiO3 ferroelectric thin films

✍ Scribed by Knauss, L. A.; Pond, J. M.; Horwitz, J. S.; Chrisey, D. B.; Mueller, C. H.; Treece, Randolph

No coin nor oath required. For personal study only.

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