๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

The Econometric Reliability of Selected Strategies Affecting Maintenence

โœ Scribed by Booth, L. E.


Book ID
117898808
Publisher
IEEE
Year
1983
Tongue
English
Weight
173 KB
Volume
PER-3
Category
Article
ISSN
0272-1724

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Reliability of devices affected by early
โœ G.C. Maccarini; L. Zavanella; A. Bugini ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 384 KB

In this paper the concept of device life has been examined from the point of view of users compelled to manage a profitable preventive maintenance of components affected by early failures. Failure device probability density function (pdf) and its cumulative curve leads also to the component reliabil