โ Scribed by G.C. Maccarini; L. Zavanella; A. Bugini
No coin nor oath required. For personal study only.
In this paper the concept of device life has been examined from the point of view of users compelled to manage a profitable preventive maintenance of components affected by early failures. Failure device probability density function (pdf) and its cumulative curve leads also to the component reliability, thus providing suitable information for the detection of the optimal replacement conditions. An analytical method together with its graphical interpretation is outlined in the appropriate sections of the study. The model brings out its efficacy especially when dealing with systems requiring high reliabilities. Under these conditions, it is also shown that the number of faults due to device breakdowns can be limited if appropriate preventive maintenance action is taken in the early failure region. This thesis is proved by simulation tests.
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