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The Diffusion Coefficient of Silicon in Thin SiC Layers as a Criterion for the Quality of the Grown Layers

✍ Scribed by Cimalla, Volker; Wöhner, T.; Pezoldt, Jörg


Book ID
120540172
Publisher
Trans Tech Publications, Ltd.
Year
2000
Tongue
English
Weight
337 KB
Volume
338-342
Category
Article
ISSN
1662-9752

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