The reststrahlen region of SiC is analysed with the goal of establishing the origin of different shapes of this band, by varying the dielectric parameters involved when simulating the reststrahlen region as obtained by infrared reflectance.
The dielectric and reststrahlen parameters of MnO
✍ Scribed by T.B. Kinney; M. O'Keeffe
- Publisher
- Elsevier Science
- Year
- 1969
- Tongue
- English
- Weight
- 105 KB
- Volume
- 7
- Category
- Article
- ISSN
- 0038-1098
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