The determination of diffusion length and surface barrier width from surface photovoltage measurements in CdSe and amorphous Si films

✍ Scribed by Moore, A. R.; Lin, Hong-sheng

• Book ID: 127049623
• Publisher: American Institute of Physics
• Year: 1987
• Tongue: English
• Weight: 538 KB
• Volume: 61
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.338275