A general purpose design-for-test method
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Johan Verfaillie; Didier Haspeslagh
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Article
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1996
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Springer US
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English
โ 424 KB
A general-purpose modular-based scan chain between the analog-digital boundary of a mixed analog/digital design is proposed. This general-purpose Design-For-Test methodology is oriented towards the test of the mixed-signal modules within the design. Implementing this structure improves the controlla