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The dependence of UMOSFET characteristics and reliability on geometry and processing

✍ Scribed by Suliman, S A; Gollagunta, N; Trabzon, L; Hao, J; Ridley, R S; Knoedler, C M; Dolny, G M; Awadelkarim, O O; Fonash, S J


Book ID
111878376
Publisher
Institute of Physics
Year
2001
Tongue
English
Weight
396 KB
Volume
16
Category
Article
ISSN
0268-1242

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