The degradation of MOS transistors resulting from junction avalanche breakdown

✍ Scribed by P.J. Dunn; P.J.T. Mellor

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 650 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(72)90582-3