✦ LIBER ✦
The degradation of MOS transistors resulting from junction avalanche breakdown : P. J. Dunn and P. J. T. Mellor. Microelectron. & Reliab. 11 (1972), p. 369
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 114 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0026-2714
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