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The defect structure and the critical current density of a highly textured YBa2Cu3O7 thin film

โœ Scribed by S. Senoussi; K. Frikach; C. Colliex


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
201 KB
Volume
235-240
Category
Article
ISSN
0921-4534

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Critical current density and flux creep
โœ G.C. Xiong; F.R. Wang; S.Z. Wang; Q.D. Jiang; J.Y. Li; Z.J. Yin; C.Y. Li; D.L. Y ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 231 KB

The superconducting transition and critical current density were studied for epitaxial YBa2Cu307\_x thin films as a function of temperature, magnetic field and electric voltage gradient. A linear section of the curve of the logarithm of apparent voltage versus transport current density, In(E)-J, was