The correlation between the breakdown voltage of power devices passivated by semi-insulating polycrystalline silicon and the effective density of interface charges

✍ Scribed by Burte, E.P.; Schulze, G.H.

• Book ID: 114537975
• Publisher: IEEE
• Year: 1991
• Tongue: English
• Weight: 492 KB
• Volume: 38
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.81646