The dependence of reverse characteristics of high voltage devices passivated by semi-insulating polycrystalline silicon on an interfacial thin film

✍ Scribed by Edmund P. Burte; Günter H. Schulze

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 372 KB
• Volume: 199
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(91)90049-4