𝔖 Bobbio Scriptorium

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The Compton backscatter technique — a new method of x-ray inspection : 40839 Roye, W. Proceedings of the 12th World Conference on Non-Destructive Testing, Amsterdam (Netherlands) 23–28 Apr. 1989, Vol. 1, pp. 31–36. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 144 KB
Volume: 28
Category: Article
ISSN: 0963-8695
DOI: 10.1016/0963-8695(95)91921-d

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