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Non-destructive testing of thin conducting films : Proceedings of the 12th world conference on non-destructive testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1519–1521. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989

✍ Scribed by V.V. Gavrilin

Publisher: Elsevier Science
Year: 1990
Weight: 170 KB
Volume: 23
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(90)90937-j

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