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The calibration of XRF polyethylene reference materials with k0-NAA and ICP-AES

✍ Scribed by Josefien Swagten; Daniël Bossus; Hanny Vanwersch

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 120 KB
Volume: 564
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2006.04.001

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