The calibration of an atomic force microscope along three coordinates using a single certified dimension

✍ Scribed by A. V. Rakov; Yu. A. Novikov; P. A. Todua

• Publisher: Springer US
• Year: 2008
• Tongue: English
• Weight: 172 KB
• Volume: 51
• Category: Article
• ISSN: 0543-1972
• DOI: 10.1007/s11018-008-9063-8