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The calculation of thin film parameters from spectroscopic ellipsometry data

✍ Scribed by G.E. Jellison Jr.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Criteria for the extraction of SIMOX mat

✍ S. Lynch; G.M. Crean; R. Greef; J. Stoemonos 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 325 KB

Spectroscopic ellipsometry characterizat

✍ J.P. Piel 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 202 KB

On the Calculation of Thin Film Refracti

✍ Holmes, D. A. 📂 Article 📅 1967 🏛 The Optical Society 🌐 English ⚖ 617 KB

Analysis of the optical properties and s

✍ N.J. Podraza; Chi Chen; Ilsin An; G.M. Ferreira; P.I. Rovira; R. Messier; R.W. C 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 224 KB

Measurement of the dielectric constant o

✍ Matsumoto, Naoki; Hosokura, Tadasu; Nagashima, Takeshi; Hangyo, Masanori 📂 Article 📅 2011 🏛 Optical Society of America 🌐 English ⚖ 375 KB

Evolution of the optical functions of th

✍ Nguyen, Hien; An, Ilsin; Collins, R. 📂 Article 📅 1993 🏛 The American Physical Society 🌐 English ⚖ 946 KB