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The behavior of high energy multiple P+ (0.5–7.5 MeV) and B+ implanted silicon and rapid thermal annealing

✍ Scribed by Wu Yuguang; Zhang Tonghe; Luo Yan; Sun Guiru


Book ID
113283175
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
273 KB
Volume
67
Category
Article
ISSN
0168-583X

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