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The basis and application of evanescent field fluorescence measurement

✍ Scribed by YF Yuan; OS Heavens

Book ID
103473515
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
124 KB
Volume
42
Category
Article
ISSN
0042-207X

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## Abstract The evanescent field surrounding an exposed planar waveguide in silica is accurately measured using scanning near field optical microscopy (SNOM) and compared to models of the field distribution. Distortions in the field due to edge effects and the proximity of the mode to the surface a