๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

The Ballast methodology for structured partial scan design

โœ Scribed by Gupta, R.; Breuer, M.A.


Book ID
119772555
Publisher
IEEE
Year
1990
Tongue
English
Weight
926 KB
Volume
39
Category
Article
ISSN
0018-9340

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


A test methodology for finite state mach
โœ Hyoung B. Min; William A. Rogers ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Springer US ๐ŸŒ English โš– 876 KB

This paper presents an efficient automatic test pattern generation technique for loop-free circuits. A partial scan technique is used to convert a sequential circuit (finite state machine) with arbitrary feedback paths into a pipelined circuit for testing. Test generation for these modified circuits

Power-oriented partial-scan design appro
โœ Jou, J.-Y.; Nien, M.-C. ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› The Institution of Electrical Engineers ๐ŸŒ English โš– 742 KB